Benefits of MISTRAL M1
Various elements can be measured non-destructively. No sample preparation is required. Even complex analytical tasks can be automated with programmable XYZ stages initiated with a single mouse click. Ultra-fast detection system provides fast results.
The M1 MISTRAL comes with a large area silicon aberration detector (SDD) with superior count rate performance and energy resolution to push detection limits down to ppm levels. The high performance detector, digital pulse processing and optimized geometric conditions result in highly efficient X-ray detection resulting in fast and accurate analytical results.
MISTRAL’s easy-to-use, maintenance-free design and powerful analytical software suite enable operation even by personnel who have received only brief training. No consumables or gas required. Rugged construction ensures ultimate stability and maintenance free operation.