The FISCHERSCOPE X-RAY 5000 instruments are innovative energy dispersive x-ray fluorescence spectrometers (EDXRF) for in-line applications in industrial production sites. They fulfill DIN ISO 3497 and ASTM B 568.
These instruments are specially designed for continuous non-destructive analysis and measurement of thin layers and layer systems in production processes. For industrial demands and maintenance free continuous operation, the design is robust and without any moving parts.
The FISCHERSCOPE X-RAY 5000 measures and analyzes layers and layer systems
– in the photo voltaic industry, i.e. CIGS, CIS, CdTe
– foils and belts
– alloys and coatings
– under ambient temperature or on very hot surfaces (up to 500?C / 932 F)
– in continuous operation and under industrial conditions
The FISCHERSCOPE X-RAY 5000 measures in a vacuum or ambient air. With its powerful semiconductor detectors, it can determine elements in the range of sodium to uranium.
For easy integration into production lines they come with a standardized mounting flange. Various modular build versions are available.