XAN 250 is universal high performance X-ray fluorescence (XRF) measuring instrument for swift and non-destructive material analysis and gauging the coating thickness. We area leading company dealing in optimum performance and superb efficiency, smooth functioning and excellent working life.
Features of XAN 250:
- Universal premium instrument with complete measurement capacities
- Equipped with high-resolution silicon drift detector (SDD) which make it suitable for rather complicated including several elements
- Functional coating measurement, beginning from a few nanometers in the semiconductor and electronics fields
- Analysis for tracking material consumer protection, such as lead content in toys
- Synthesis of alloys with optimum requirements of precision in the watch and jewelry industries along with metal refineries.
|Dimension||403 x 588 x 365 mm|
|Power Supply||AC 230 V 50 / 60 Hz|