The FISCHERSCOPE® X-RAY XDL® and XDLM® X-ray fluorescence (XRF) spectrometers are closely related to the XUL series. All the main components – such as the detector, X-ray tubes and filter combinations – are identical. But there is a significant difference: The XDL and XDLM devices measure from top to bottom. And that means convenient XRF analysis of non-flat samples – complex shapes are no longer a problem!
Electroplated, galvanized coatings such as zinc on iron as corrosion protection
Serial testing of mass-produced parts
Analysis of the composition of special steels, e.g. detection of molybdenum in A4
Decorative chrome coatings, e.g. Cr/Ni/Cu/ABS
All typical chrome coatings – also new ones such as CrVI
Measurement of functional gold coatings on printed circuit boards such as Au/Ni/Cu/PCB or Sn/Cu/PCB
Coatings on connectors and contacts in the electronics industry such as Au/Ni/Cu and Sn/Ni/Cu