Fischerscope X-ray Xdv Sdd




Product Description

is an optimally performing X-ray fluorescence (XRF) measuring system having a programmable XY-stage and Z-axis for trace analysis and automatic measurements of extremely thin coatings.


  • Outstanding designs with universal application attributes
  • Flexibility of highest excitation for the spectral composition and measurement spot size
  • Provided with silicon drift detector which can enable detection of extremely high intensities > 100 kcps without a energy resolution deficit
  • Big and conveniently reachable measurement chamber
  • Outstanding repeatability and extremely low detection limits
  • Electronics and semiconductor industries
  • Detection of harmful substances, as per RoHS, packaging standards and toy standards
  • Analysis of precious metal like Gold with optimum level of accuracy
  • Measurement of thickness and composition of NiP-layers
  • Photovoltaic industry


Usage/Application Analysis of Gold,Silver and other precious metals
Model Number/Name XDV-SDD
Analysis Elements Silver, Copper, GUsed, Platinum
Operation Mode Automatic
Automation Grade Automatic
Power Type Electric
Dimension 403 x 588 x 365 mm
Brand Fischer
Power Supply AC 115 V or AC 230 V 50 / 60 Hz
Protection Class IP40
Repeatability Greater than 1 % for gold,measurement time 60 sec



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