Oxford CMI900 Thickness and Material Composition


SKU: TEP0083 Category:


CMI900 – For Measurement of Coating Thickness and Material Composition
CMI900? is a cost effective, high performance XRF analyser for
measurement of coating thickness and material composition.
Measure the thickness and/or composition of plating, coating, thin films
from Ti to U
5 layers / 15 elements / Common elements correction
Composition analysis of up to 15 elements simultaneously

Standard 50 Watt Micro-Focus? X-ray Tube
Increased count rate, improved precision
75 W upgrade
Multiple Collimators
Optimize the balance between count rate and spot sizes
Laser Focus
Improves system reproducibility (operator independent)
Standard FP Software Package
Complex application modeling
Ease of calibration
Slotted Chamber with motorized Z axis control


There are no reviews yet.

Be the first to review “Oxford CMI900 Thickness and Material Composition”

Your email address will not be published. Required fields are marked *