SciAps X-200




SciAps X-200
Identical to X-200 for elements titanium and higher elements. No 2nd beam calibrations, so Mg, Al, Si, P and S are NOT analyzed.
Perfect for locations requiring the speed and precision of an SDD detector, but with no need for 2 beam, light element analysis.
An alternative to PINs if you want 9x the speed or 3X the precision.


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