SKU: TEP0122 Category:


Cost-effective and compact entry-level X-Ray Fluorescence (XRF) Measuring Instrument for fast and non-destructive Analysis and Coating Thickness Measurement of Gold and Silver Alloys

Lightweight instrument, compact design, low mass (appr. 25 kg, 55 lb) and small footprint
Specialised for the cost-effective XRF analysis of gold alloys
Fixed aperture and fixed filter; thus particularly suited for precious metal analysis
With semiconductor detector also applicable for more complex analyses with many elements
Measuring direction from bottom to top, this allows for quick and easy sample positioning ?

Typical fields of application are the analysis of
Gold and precious metal analysis in the jewellery and watch industries
Analysis of dental alloys
Yellow and white gold
Platinum and silver
Alloys and coatings
Multi layer coatings


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